Elastic light scattering by thin films : Spectroscopic Measurements and analysis
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TextPublication details: Uppsala : Acta Universitatis Upsaliensis, 1996.Description: 83p. : ill. ; 22cmISBN: - 9155437591
- PAM QC454.L63R66 No.208
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| Cover image | Item type | Current library | Home library | Collection | Shelving location | Call number | Materials specified | Vol info | URL | Copy number | Status | Notes | Date due | Barcode | Item holds | Item hold queue priority | Course reserves | |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Pamphlet | UDSM Library | Science and Engineering Collection | PAM QC454.L63R66 No.208 (Browse shelf(Opens below)) | Available | 000000242236 |
Total holds: 0
Browsing Directorate of Library Services (UDSM) shelves,Collection: Science and Engineering Collection Close shelf browser (Hides shelf browser)
| PAM QC175.25.M3 Quantum dynamics of molecular systems and guided matter waves | PAM QC176.84.R3G3 Thin films and deposition processes studied by soft X-Ray spectroscopy | PAM QC318.E55.H32 Enthalpy-entropy diagram for steam SI | PAM QC454.L63R66 No.208 Elastic light scattering by thin films : Spectroscopic Measurements and analysis | PAM QC482.S6Q2 Soft X-ray spectroscopy study of fullerene based transition-metal compounds and related systems | PAM QC764.5.T79 First principles studies of magnetic and structural properties of metallic systems | PAM QC793.2.M56 Nuclear and particle physics |
Includes bibliographical references
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